Unlike Scanning Electron Microscopy that bounces electrons off the surface of a sample to produce an image, Transmission Electron Microscopes (TEMs) shoot the electrons completely through the sample.
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
Scientists have calculated how it is possible to look inside the atom to image individual electron orbitals. An electron microscope can't just snap a photo like a mobile phone camera can. The ability ...
AES operates on the principle of the Auger effect, named after the French physicist Pierre Auger. When a material's surface is bombarded with a beam of high-energy electrons or photons, it causes the ...
Carbon nanotube field emitters are at present the brightest available electron sources but must operate at low currents to avoid Coulomb expansion and are therefore not suitable for ultrafast imaging.
It may not have won an Oscar, but the tiny electron has finally made its film debut. A new video shows how an electron rides on a light wave after just having been pulled away from an atom. This is ...
image: The metallic tip of a scanning tunneling microscope drives the magnetic quantum state of an iron atom into a different direction while injected electrons destroy this state superposition. This ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results